• DocumentCode
    3328745
  • Title

    Breakdown lemiter studies for high power X-band microwaves

  • Author

    Holmquist, David ; Kirley, Matt ; Cook, Carson ; Scharer, John ; Booske, John

  • Author_Institution
    Univ. of Wisconsin-Madison, Madison, WI, USA
  • fYear
    2010
  • fDate
    20-24 June 2010
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Summary form only given. The design, fabrication and initial measurements and analysis of an X-band high power microwave (HPM) limiter are presented. The microwave discharge test chamber is an L-band rectangular waveguide with Lexan or Rexolite microwave windows. The chamber is illuminated by the output of an X-band waveguide pressed against the chamber window. The objective is to study conditions and configurations that enable rapid (<; 50 ns) discharge formation above a pre-set power density threshold. A 25 kW X-band magnetron (9.38 GHz) with a 0.8 μs pulse width is used to produce the breakdown. Incident, reflected and transmitted microwave powers and optical emission intensities are measured to observe the discharge breakdown and extinction rates near Paschen minimum pressures for Ar and Ar/Ne mixtures in the 10s of Torr range. Design modeling, preliminary experimental data and data analyses are presented.
  • Keywords
    argon; high-frequency discharges; magnetrons; neon; plasma filled waveguides; plasma pressure; Ar-Ne; L-band rectangular waveguide; Lexan microwave window; Rexolite microwave window; X-band high power microwave limiter; X-band magnetron; discharge breakdown; discharge formation; frequency 9.38 GHz; high power X-band microwave; microwave discharge test chamber; microwave power transmission; optical emission intensity; power 25 kW; preset power density threshold; Argon; Electric breakdown; Fabrication; L-band; Microwave measurements; Optical pulses; Optical waveguides; Power measurement; Rectangular waveguides; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2010 Abstracts IEEE International Conference on
  • Conference_Location
    Norfolk, VA
  • ISSN
    0730-9244
  • Print_ISBN
    978-1-4244-5474-7
  • Electronic_ISBN
    0730-9244
  • Type

    conf

  • DOI
    10.1109/PLASMA.2010.5533981
  • Filename
    5533981