Title :
Design for diagnostics views and experiences
Author :
Rao, Vallluri R.
Author_Institution :
Intel Corp., Santa Clara, CA, USA
Abstract :
Design For Diagnostics (DFD) is critical for rapid silicon debug of new product and ramping to high volume manufacturing. I feel two aspects of DFD are important. The first enables software fault localization tools that quickly localize to the failing node (this includes ad hoc DFT methods, scan etc.). The second type of DFD enables success with physical localization tools. This includes designed in physical features to enable rapid bug verification with focused ion beam milling, and probe points for internal signal probing. Both types of DFD are needed and complement each other in the different phases of silicon debug and root cause analysis
Keywords :
design for testability; fault diagnosis; focused ion beam technology; integrated circuit testing; logic testing; Intel experiences; ad hoc DFT methods; bonus cells; bonus inverter gates; design for diagnostics; designed in physical features; die internal probing; failing node; focused ion beam milling; high volume manufacturing; internal signal probing; physical localization tools; probe points; ramping; rapid bug verification; rapid silicon debug; root cause analysis; scan methods; software fault localization tools; speed path fix; uncommitted logic elements; Delay; Design for disassembly; Design optimization; Inverters; Ion beams; Milling; Performance analysis; Probes; Silicon; Testing;
Conference_Titel :
Test Conference, 1998. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5093-6
DOI :
10.1109/TEST.1998.743328
