High speed digital transceivers: A challenge for manufacturing

Author

Cole, Clifford B. ; Warwick, Thomas Phillip

Author_Institution

Lucent Technol., Allentown, PA, USA

fYear

1999

fDate

1999

Firstpage

211

Lastpage

215

Abstract

The evolution of personal computers and network servers is pushing the micro-electronics industry to integrate high speed transceiver macrocells onto CMOS Integrated Circuits (IC). Some examples of high speed transceiver standards are: Fiberchannel, Gigabit Ethernet, NGIO, FireWire (IEEE 1394), USB 2.0 and VESA display standards. ASICs designed for DATACOM and TELECOM applications and standard products such as FireWire (IEEE 1394) are currently running in the 400 Mb/S to 800 Mb/S data rate range. Fast data rates, coupled with low voltage swings and differential buffers, such as LVDS (Low voltage differential swing) buffers, are presenting challenges to the current generation of ATE. It has now become technically feasible to integrate gigabit transceiver macrocells into CMOS ASIC´s. Gigabit transceivers are being designed into digital ASIC designs such as disk drive controllers and Ethernet switches. The need for high quality, yet low cost solutions to test these macrocells, and stand alone standard products, has become essential

Keywords

CMOS digital integrated circuits; application specific integrated circuits; automatic test equipment; design for testability; high-speed integrated circuits; integrated circuit testing; local area networks; telecommunication equipment testing; telecommunication standards; transceivers; 400 to 800 Mbit/s; ASICs; ATE; CMOS ICs; DFT; Ethernet switches; Fiberchannel; FireWire; Gigabit Ethernet; LVDS buffers; differential buffers; disk drive controllers; fast data rates; gigabit transceiver macrocells; high quality low cost test solutions; high speed digital transceivers; high speed transceiver macrocells; low voltage swings; CMOS integrated circuits; Computer industry; Ethernet networks; Firewire; Low voltage; Macrocell networks; Manufacturing; Microcomputers; Network servers; Transceivers;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1999. Proceedings. International

Conference_Location

Atlantic City, NJ

ISSN

1089-3539

Print_ISBN

0-7803-5753-1

Type

conf

DOI

10.1109/TEST.1999.805632

Filename

805632