Title :
Functional ATE can meet the challenges
Author :
West, Burnell G.
Author_Institution :
ATE Div., Schlumberger Technol., San Jose, CA, USA
Abstract :
The SIA Roadmap presents some challenges which focus our attention on the cost and performance of functional ATE. High cost and demanding test performance requirements have been perceived as potential barriers to semiconductor production for the last 15 years or more-and predictions of the “death of ATE as we know it” have been heard at least that long. With forecasts of $35 million for 5300 pin testers frightening fab line managers worldwide, these predictions seem even more justified now. But are they? An attempt is made to answer this question
Keywords :
automatic test equipment; automatic test pattern generation; electronics industry; integrated circuit testing; ATE cost; ATE performance; SIA Roadmap; critical timing paths; debug requirement; functional ATE; pattern generation; performance measurement requirement; semiconductor industry; Clocks; Costs; Economic forecasting; Isolation technology; Measurement; Power generation; Production; Test pattern generators; Testing; Timing;
Conference_Titel :
Test Conference, 1998. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5093-6
DOI :
10.1109/TEST.1998.743354
