Title :
Method of moments electromagnetic emission simulations of metal lids over high-speed chips compared to measured results
Author :
Tomsio, Nayon ; Davis, James H.
Author_Institution :
EMC Eng., IBM Corp., Austin, TX, USA
Abstract :
The EMI (emission testing) failure caused by a floating metal lid on a clock module resulted in an opportunity ideal for comparisons to numerical simulation. The radiation was not layout dependent and the results of all the experiments were repeatable. The radiated emissions from a 62.5 MHz clock caused the product to fail at 1.8 GHz. Limitations of the physical experiments include having data taken at fixed frequencies and over a fixed frequency range. The experimental limitation was removed when a greater number of frequencies can be analyzed with simulation. The IBM Austin Site is now using a tool developed by IBM Research in Yorktown which is a method of moments (MoM), full-wave solver to Maxwell´s equations to help predict and correct EMI related problems
Keywords :
Maxwell equations; circuit analysis computing; clocks; digital simulation; electromagnetic interference; integrated circuit testing; method of moments; modules; software tools; 1.8 GHz; 62.5 MHz; EMI emission testing; EMI failure; EMI related problems correction; EMI related problems prediction; IBM Austin Site; IBM Research; Maxwell´s equations; clock module; electromagnetic emission simulations; experiments; floating metal lid; full-wave solver; high-speed chips; measured results; method of moments; numerical simulation; radiated emissions; radiation; Analytical models; Clocks; Conductors; Electromagnetic compatibility; Electromagnetic measurements; Electromagnetic radiation; Frequency; Numerical simulation; Semiconductor device measurement; Testing;
Conference_Titel :
Electromagnetic Compatibility, 1995. Symposium Record., 1995 IEEE International Symposium on
Conference_Location :
Atlanta, GA
Print_ISBN :
0-7803-3608-9
DOI :
10.1109/ISEMC.1995.523580
