National Science Foundation Workshop on Future Research Directions in Testing of Electronic Circuits and Systems: executive summary of workshop report

A two-day meeting, sponsored by National Science Foundation, was held in Santa Barbara, California on May 12 and 13, 1998 to discuss the academic research topics and education issues in testing of electronic circuits and systems. The goals of the meeting were (1) to identify emerging and mature research areas within the VLSI testing field, in order to help focus the field on research necessary to develop algorithms and techniques for testing VLSI circuits and systems designed using future technologies, (2) to address issues related to increasing the impact of the VLSI test field on education in electrical and computer engineering, and (3) to identify models and mechanisms for enhancing the interaction, collaboration and data-sharing between industry and academia. Four working groups were formed in the meeting: two groups focusing on the identification of emerging and mature research topics, one on industry and university interaction/collaboration, and one on test education. A brief summary of a report containing findings and recommendations from these four working groups is presented