DocumentCode
3328940
Title
Design of a test simulation environment for test program development
Author
Riordan, J.J.O.
Author_Institution
Analog Devices, Limerick, Ireland
fYear
1999
fDate
1999
Firstpage
237
Lastpage
244
Abstract
Analog Devices has developed its own custom test simulation environment. Five pilot projects have been successfully completed to-date using this product. The design of this test simulation environment is presented
Keywords
automatic test equipment; automatic test pattern generation; automatic test software; integrated circuit testing; mixed analogue-digital integrated circuits; programming environments; virtual instrumentation; ADICE simulator; ATE simulation; IMAGE ExChange; Teradyne programming environment; analog subsystem; custom test simulation environment; digital subsystem; integrated environment; mixed signal test; simulation environment design; test program development; virtual test environment; Automatic test equipment; Automatic testing; Discrete event simulation; Emulation; Engines; Monitoring; Product design; Programming environments; Signal design; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1999. Proceedings. International
Conference_Location
Atlantic City, NJ
ISSN
1089-3539
Print_ISBN
0-7803-5753-1
Type
conf
DOI
10.1109/TEST.1999.805636
Filename
805636
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