DocumentCode :
3329059
Title :
Radiation damage studies for the DØ Silicon Micro-strip Tracker at the Tevatron
Author :
Ye, Zhenyu
Author_Institution :
Fermi Nat. Accel. Lab., Batavia, IL, USA
fYear :
2009
fDate :
Oct. 24 2009-Nov. 1 2009
Firstpage :
163
Lastpage :
167
Abstract :
A Silicon Micro-strip Tracker has been operating at the DØ experiment at the Fermilab Tevatron collider (Batavia, Illinois, USA) since 2001. The sensor leakage current, full depletion voltage, signal size and noise level are continuously monitored for radiation damage. Predictions are also made for the detector parameters towards the end of the Tevatron Run II. These predictions are based on the locations and types of the sensors, our knowledge and measurements of the phenomenology of radiation damage as well as the actual dose received in the Tevatron environment. We present the results of these aging studies and predictions in this talk.
Keywords :
ageing; leakage currents; position sensitive particle detectors; radiation effects; silicon radiation detectors; DÃ\x98 experiment; Fermilab Tevatron collider; Silicon Microstrip Tracker; Tevatron Run II; aging; full depletion voltage; noise level; radiation damage; sensor leakage current; signal size; Chemical sensors; Collaboration; Detectors; Large Hadron Collider; Nuclear and plasma sciences; Sensor phenomena and characterization; Silicon; Strips; Surface-mount technology; USA Councils; D⊘; Silicon Micro-strip Tracker; Tevatron; radiation damage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
Conference_Location :
Orlando, FL
ISSN :
1095-7863
Print_ISBN :
978-1-4244-3961-4
Electronic_ISBN :
1095-7863
Type :
conf
DOI :
10.1109/NSSMIC.2009.5401825
Filename :
5401825
Link To Document :
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