Title :
Concurrent Error Detection for a Network of Combinational Logic Blocks Implemented with Memory Embedded in FPGAs
Author :
Krasniewski, Andrzej
Author_Institution :
Inst. of Telecommun., Warsaw Univ. of Technol., Warsaw
Abstract :
We propose a concurrent error detection (CED) scheme for a network of combinational logic blocks implemented with memory embedded in FPGAs. The proposed scheme is proven to detect - without latency - any permanent or transient fault associated with a single input or output of any component of the network. The experimental results show that the overhead for the presented CED technique is low (23.9% for the examined network), especially when compared with solutions intended for gate-based designs (55% or 81%, depending on the technique, for the same network).
Keywords :
combinational circuits; error detection; field programmable gate arrays; FPGA; combinational logic blocks; concurrent error detection; gate-based designs; transient fault; Circuit faults; Design methodology; Digital circuits; Digital systems; Electrical fault detection; Fault detection; Fault tolerance; Field programmable gate arrays; Flip-flops; Logic design; FPGA; combinational logic; concurrent error detection; embedded memory; single event upsets;
Conference_Titel :
Digital System Design Architectures, Methods and Tools, 2008. DSD '08. 11th EUROMICRO Conference on
Conference_Location :
Parma
Print_ISBN :
978-0-7695-3277-6
DOI :
10.1109/DSD.2008.31