DocumentCode
3329209
Title
Concurrent Error Detection for a Network of Combinational Logic Blocks Implemented with Memory Embedded in FPGAs
Author
Krasniewski, Andrzej
Author_Institution
Inst. of Telecommun., Warsaw Univ. of Technol., Warsaw
fYear
2008
fDate
3-5 Sept. 2008
Firstpage
250
Lastpage
255
Abstract
We propose a concurrent error detection (CED) scheme for a network of combinational logic blocks implemented with memory embedded in FPGAs. The proposed scheme is proven to detect - without latency - any permanent or transient fault associated with a single input or output of any component of the network. The experimental results show that the overhead for the presented CED technique is low (23.9% for the examined network), especially when compared with solutions intended for gate-based designs (55% or 81%, depending on the technique, for the same network).
Keywords
combinational circuits; error detection; field programmable gate arrays; FPGA; combinational logic blocks; concurrent error detection; gate-based designs; transient fault; Circuit faults; Design methodology; Digital circuits; Digital systems; Electrical fault detection; Fault detection; Fault tolerance; Field programmable gate arrays; Flip-flops; Logic design; FPGA; combinational logic; concurrent error detection; embedded memory; single event upsets;
fLanguage
English
Publisher
ieee
Conference_Titel
Digital System Design Architectures, Methods and Tools, 2008. DSD '08. 11th EUROMICRO Conference on
Conference_Location
Parma
Print_ISBN
978-0-7695-3277-6
Type
conf
DOI
10.1109/DSD.2008.31
Filename
4669244
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