• DocumentCode
    3329214
  • Title

    W-band on-wafer measurement of uniplanar slot-type antennas

  • Author

    Raman, S. ; Gauthier, G.P. ; Rebeiz, G.M.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
  • Volume
    1
  • fYear
    1997
  • fDate
    13-18 July 1997
  • Firstpage
    554
  • Abstract
    Uniplanar slot-type antennas such as coplanar waveguide fed single- and dual-polarized slot-ring antennas and double folded-slot antennas are characterized using a millimeter-wave network analyzer and on-wafer measurement techniques. The antennas are designed to be mounted on a dielectric lens to minimize power loss into substrate modes and realize high-gain antenna patterns. On-wafer measurements are performed by placing the antenna wafer on a thick dielectric spacer of similar /spl epsiv//sub r/ and eliminating the reflection from the probe station chuck with time-domain gating. The measured results agree well with method-of-moments simulations.
  • Keywords
    antenna radiation patterns; antenna testing; coplanar waveguides; electromagnetic wave polarisation; method of moments; millimetre wave antennas; millimetre wave measurement; permittivity; slot antennas; W-band on-wafer measurement; antenna wafer; coplanar waveguide fed antennas; dielectric lens; double folded-slot antennas; dual-polarized slot-ring antennas; high-gain antenna patterns; measured results; method of moments simulations; millimeter-wave network analyzer; power loss; probe station chuck; relative permittivity; single-polarized slot-ring antennas; substrate modes; thick dielectric spacer; time-domain gating; uniplanar slot-type antennas; Antenna measurements; Coplanar waveguides; Dielectric losses; Dielectric measurements; Dielectric substrates; Measurement techniques; Millimeter wave measurements; Millimeter wave technology; Optical design; Slot antennas;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 1997. IEEE., 1997 Digest
  • Conference_Location
    Montreal, Quebec, Canada
  • Print_ISBN
    0-7803-4178-3
  • Type

    conf

  • DOI
    10.1109/APS.1997.630221
  • Filename
    630221