• DocumentCode
    3329223
  • Title

    The transient response of a Duffing resonator following a parameter change

  • Author

    Deng, Chenchen ; Collins, Steve

  • Author_Institution
    Dept. of Eng. Sci., Univ. of Oxford, Oxford, UK
  • fYear
    2009
  • fDate
    2-5 Aug. 2009
  • Firstpage
    790
  • Lastpage
    793
  • Abstract
    If driven with sufficient force a Duffing resonator has sharp transitions in both amplitude and phase at two critical frequencies which could be exploited to make sensitive sensors. In this paper new results are presented which show that when the resonator is driven hard to enhance the change in amplitude any change in the resonator parameters is followed by a delayed response. Results from numerical simulations and tests of a ´Duffing´ circuit are then presented that show that this undesirable behaviour can be avoided by carefully selecting the force used to drive the resonator. This proposed driving scheme is expected to give rise to fast, reliable, sensitive mass sensor.
  • Keywords
    circuit testing; micromechanical resonators; transient response; Duffing circuit; MEMS Duffing resonator; critical frequencies; delayed response; numerical simulations; transient response; Chemical and biological sensors; Circuit simulation; Circuit testing; Delay; Equations; Force sensors; Numerical simulation; Resonant frequency; Sensor phenomena and characterization; Transient response;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2009. MWSCAS '09. 52nd IEEE International Midwest Symposium on
  • Conference_Location
    Cancun
  • ISSN
    1548-3746
  • Print_ISBN
    978-1-4244-4479-3
  • Electronic_ISBN
    1548-3746
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2009.5235887
  • Filename
    5235887