Title :
Restricted Chaining and Fragmentation Techniques in Power Aware High Level Synthesis
Author :
Barrio, Alberto A Del ; Molina, Maria C. ; Mendias, Jose M. ; Andres, Esther ; Hermida, Roman
Author_Institution :
Dipt. Arquitectura de Comput. y Autom., Univ. Complutense de Madrid, Madrid
Abstract :
A complete power-aware high-level synthesis algorithm is presented. It performs the schedule, resource allocation and binding of behavioral specifications. It overcomes the limitations of low-power algorithms and based on a bit-level timing model and a study of the target technology, tries to chain in the same cycle as many operations as possible. It also fragments the functional units, not the operations, for diminishing the required hardware. We also keep a minimum performance by estimating the cycle time while we are chaining operations. This way we obtain a reduction for both the static power and the dynamic one. We achieve an additional dynamic power reduction by studying the Hamming distance and applying partial or total commutative property. Experimental results on real circuits show great improvements in both power and energy consumption and performance over conventional low power algorithms.
Keywords :
formal specification; high level synthesis; low-power electronics; resource allocation; scheduling; Hamming distance; behavioral specification binding; bit-level timing model; commutative property; cycle time estimation; dynamic power reduction; energy consumption; functional unit fragmentation technique; low-power algorithm; power aware high level synthesis algorithm; resource allocation; restricted chaining technique; scheduling algorithm; static power reduction; Capacitance; Clocks; Delay; Digital systems; Energy consumption; Frequency; High level synthesis; Switching circuits; Timing; Voltage; High-level synthesis; allocation; binding; low power; scheduling;
Conference_Titel :
Digital System Design Architectures, Methods and Tools, 2008. DSD '08. 11th EUROMICRO Conference on
Conference_Location :
Parma
Print_ISBN :
978-0-7695-3277-6
DOI :
10.1109/DSD.2008.120