• DocumentCode
    3329301
  • Title

    A dead-time correction method for multiple gamma-ray detection

  • Author

    Kimura, A. ; Furutaka, K. ; Goko, S. ; Harada, H. ; Igashira, M. ; Kamiyama, T. ; Katabuchi, T. ; Kin, T. ; Kino, K. ; Kitatani, F. ; Kiyanagi, Y. ; Koizumi, M. ; Mizumoto, M. ; Nakamura, S. ; Ohta, M. ; Oshima, M. ; Toh, Y.

  • Author_Institution
    Res. group for Innovative Nucl. Sci., Japan Atomic Energy Agency, Tokai, Japan
  • fYear
    2009
  • fDate
    Oct. 24 2009-Nov. 1 2009
  • Firstpage
    138
  • Lastpage
    143
  • Abstract
    To correct dead time in TOF experiments with multi-detector gamma-ray detection method, we have tested a dead-time correction method. In this dead-time correction method, random timing pulses generated by a random pulse generator are input to every pre-amplifier via test-signal inputs. Both the random timing pulses and the other pulses originated from gamma rays are measured with a data acquisition system (DAQ). At the same time, a number of the input random timing pulses are counted with another fast system. Because dead time affects similarly both the pulses from the random pulse generator and the measured gamma rays, we can calculate the dead time by comparing the number of the input random timing pulses counted by the fast system with an area count of the peak due to the random timing pulses measured with the DAQ.
  • Keywords
    data acquisition; gamma-ray detection; nuclear electronics; pulse generators; readout electronics; timing; TOF experiments; data acquisition system; dead-time correction method; multidetector gamma-ray detection method; multiple gamma-ray detection; preamplifier; random pulse generator; random timing pulses; test-signal inputs; Area measurement; Data acquisition; Gamma ray detection; Gamma ray detectors; Gamma rays; Pulse generation; Pulse measurements; Testing; Time measurement; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-3961-4
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2009.5401837
  • Filename
    5401837