• DocumentCode
    3329792
  • Title

    Modeling noise properties of a high resolution CMOS detector for X-ray digital mammography

  • Author

    Kalyvas, N. ; Michail, C. ; Fountos, G. ; Valais, I. ; Liaparinos, P. ; Seferis, I. ; Spyropoulou, V. ; Mytafidis, A. ; Panayiotakis, G. ; Kandarakis, I.

  • Author_Institution
    Dept. of Med. Instrum. Technol., Technol. Educ. Inst. of Athens, Athens, Greece
  • fYear
    2011
  • fDate
    23-29 Oct. 2011
  • Firstpage
    2465
  • Lastpage
    2470
  • Abstract
    A theoretical model based on Linear Cascaded Systems (LCS) theory was developed in order to study the noise properties of a commercially available high resolution CMOS sensor (RadEye CMOS). The parameters studied were the Normalized Noise Power Spectrum (NNPS) and the Noise Transfer Function (NTF). The modeling was applied to digital mammography conditions. It considered the physical properties of the scintillator incorporated into RadEye CMOS as well as the probability of X-ray absorption directly in the photoreceptor. Furthermore it took into account the pixel pitch and the thickness of the photoreceptor. The model was compared with experimental results obtained from literature. The NTF curves were I good agreement with the experimentally determined. NNPS curves deviations were attributed to the effect of the digitization procedure as well as the non-linear behavior of CMOS detector.
  • Keywords
    CMOS image sensors; X-ray absorption; X-ray detection; diagnostic radiography; mammography; CMOS detector; Linear Cascaded Systems theory; NNPS; NTF; RadEye CMOS; X-ray absorption; X-ray digital mammography; noise transfer function; normalized noise power spectrum; photoreceptor; CMOS integrated circuits; Data models; Detectors; Semiconductor device modeling; X-ray imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE
  • Conference_Location
    Valencia
  • ISSN
    1082-3654
  • Print_ISBN
    978-1-4673-0118-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2011.6152669
  • Filename
    6152669