DocumentCode :
3329811
Title :
Covered-Conductor Overhead Distribution Line Modeling and Experimental Verification for Determining its Line Characteristics
Author :
Hashmi, G. Murtaza ; Lehtonen, Matti
Author_Institution :
Power Syst. & High Voltage Eng. Lab., Helsinki Univ. of Technol., Espoo
fYear :
2007
fDate :
16-20 July 2007
Firstpage :
1
Lastpage :
7
Abstract :
In this paper, theoretical model of the covered-conductor (CC) overhead distribution line is presented and the frequency-dependent distributed transmission line (TL) parameters, wave propagation characteristics, and characteristic impedance are calculated. The derived wave propagation characteristics are compared with those obtained from the time domain reflectometry (TDR) measurements to validate the theoretical model of the CC line. The TDR measuring system is also simulated in EMTP/ATP as real time verification. An accurate determination of the TL characteristics for practical CC lines can be used as a design aid for the modeling of partial discharge (PD) measuring system in EMTP/ATP; thus deciding the optimal locations of the sensors in getting reliable PD detection results due to falling trees on the lines.
Keywords :
overhead line conductors; partial discharges; power overhead lines; ATP; EMTP; TDR; characteristic impedance; covered-conductor overhead distribution line; frequency-dependent distributed transmission line; line characteristics; partial discharge measuring system; time domain reflectometry; wave propagation characteristics; EMTP; Frequency; Impedance; Partial discharge measurement; Partial discharges; Power distribution lines; Power overhead lines; Reflectometry; Transmission line measurements; Transmission line theory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Engineering Society Conference and Exposition in Africa, 2007. PowerAfrica '07. IEEE
Conference_Location :
Johannesburg
Print_ISBN :
978-1-4244-1477-2
Electronic_ISBN :
978-1-4244-1478-9
Type :
conf
DOI :
10.1109/PESAFR.2007.4498072
Filename :
4498072
Link To Document :
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