DocumentCode :
3329997
Title :
SDIVA: Structural Delay Insensitivity Verification Analysis Method for Bit-Level Pipelined Systolic Arrays with Early Output Evaluation
Author :
Ismailoglu, A. Neslin ; Askar, Murat
Author_Institution :
Dept. of Electr. & Electron. Eng., Middle East Tech. Univ., Ankara
fYear :
2008
fDate :
3-5 Sept. 2008
Firstpage :
566
Lastpage :
571
Abstract :
A structural delay-insensitivity verification analysis method, SDIVA, is proposed for asynchronous systolic arrays in dual-rail threshold logic style. The SDIVA method employs symbolic delays for all output evaluation paths and works at the behavioral specification level. For bit-level pipelined systolic arrays, which have data-dependent early output evaluation in one-dimension, SDIVA method reduces the verification analysis task to examination of three adjacent systoles so that by analyzing all possible early/late output evaluation scenarios on three systoles, the delay-insensitivity of a complete systolic array could be verified at once, regardless of the array dimensions. Delay-insensitivity violations are located and corrected at structural level, without diminishing the early output evaluation benefits. Since symbolic delays are used without imposing any timing assumptions on the environment; the SDIVA method is technology independent and robust against all physical and environmental variations.
Keywords :
asynchronous circuits; formal verification; systolic arrays; SDIVA; asynchronous circuits; asynchronous systolic arrays; bit-level pipelined systolic arrays; dual-rail threshold logic style; structural delay-insensitivity verification analysis method; Asynchronous circuits; Cost function; Delay effects; Latches; Logic arrays; Logic design; Pipeline processing; Robustness; Systolic arrays; Timing; Asynchronous Logic Circuits; Pipeline Arithmetic; Pipeline Processing; Systolic Arrays;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Digital System Design Architectures, Methods and Tools, 2008. DSD '08. 11th EUROMICRO Conference on
Conference_Location :
Parma
Print_ISBN :
978-0-7695-3277-6
Type :
conf
DOI :
10.1109/DSD.2008.117
Filename :
4669286
Link To Document :
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