DocumentCode
3330120
Title
Embedded X86 testing methodology
Author
Basto, Luis ; Khan, Asif ; Hodakievic, Pete
Author_Institution
Adv. Micro Devices, Austin, TX, USA
fYear
1999
fDate
1999
Firstpage
487
Lastpage
492
Abstract
The embedded core testing methodology at Advanced Micro Devices Inc. Involves adopting a disciplined system for developing new products with a focus on time to market and engineering productivity. A key factor is to achieve high and verifiable fault coverage for designs by closely adhering to guidelines and by increased test automation. This paper addresses the design for test (DFT) aspects of the methodology, production testing of embedded CPU cores, and provides some data on completed designs
Keywords
automatic testing; computer testing; design for testability; embedded systems; integrated circuit testing; logic testing; microprocessor chips; production testing; Advanced Micro Devices; DFT; IDDQ; X86 testing; dealy testing; embedded CPU cores; embedded core testing; engineering productivity; production testing; resimulation; scan methods; test clocks; Automatic test pattern generation; Automatic testing; Design for testability; Guidelines; Libraries; Logic testing; System testing; System-on-a-chip; Time to market; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1999. Proceedings. International
Conference_Location
Atlantic City, NJ
ISSN
1089-3539
Print_ISBN
0-7803-5753-1
Type
conf
DOI
10.1109/TEST.1999.805771
Filename
805771
Link To Document