Title :
Towards a standardized procedure for automatic test equipment timing accuracy evaluation
Author :
Cai, Y. ; Ortner, W.R. ; Garrenton, C.T.
Author_Institution :
AT&T Bell Labs., Allentown, PA, USA
Abstract :
Because of the lack of consistency in automatic test equipment (ATE) timing specifications, the usefulness of suppliers´ specification sheets are very limited. SEMATECH has proposed an ATE Specification Standard to unify the definitions of ATE specifications and verification procedures. We present the effectiveness and limitations of this standard based on our ATE evaluation practice. Three additional tests are added beyond the SEMATECH scope to address some significant timing errors related to output compare. This includes termination dependent delay error, receiver bandwidth limit, and compare output jitter. We will demonstrate that these errors are significant parts of the overall timing accuracy (OTA). This work is an effort toward a common timing validation criteria
Keywords :
automatic test equipment; calibration; delays; integrated circuit testing; measurement errors; production testing; semiconductor device testing; standardisation; timing jitter; ATE Specification Standard; ATE evaluation; SEMATECH; automatic test equipment; delay error; effectiveness; receiver bandwidth limit; semiconductor industry; standardized procedure; timing accuracy; timing specifications; timing validation criteria; utput jitter; Accuracy; Automatic test equipment; Automatic testing; Bandwidth; Benchmark testing; Circuit testing; Delay; Independent component analysis; Instruments; Timing jitter;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805774
