Title :
Robust and high performance subthreshold standard cell design
Author :
Amarchinta, S. ; Kanitkar, H. ; Kudithipudi, D.
Author_Institution :
Dept. of Comput. Eng., Rochester Inst. of Technol., Rochester, NY, USA
Abstract :
Digital subthreshold circuits are gaining importance because of their ability to serve as an ideal low power solution. In this paper, a methodology to design a performance enhanced subthreshold standard cell library robust to process variations is discussed. Several approaches to design a performance enhanced cell library are discussed and an optimal design choice is made with energy-delay product as a metric. Significant performance improvements of 2X, 8X and 1.5X are achieved for inverter, AND, and OR cells respectively over regular cell library. The variation in delay for the proposed standard cell library with respect to four process corners is studied. A significant reduction of about 75.6% in delay variation across worst case process corners was observed when a normal inverter and inverter from the high performance cell library were simulated.
Keywords :
CMOS digital integrated circuits; integrated circuit design; invertors; logic gates; low-power electronics; AND gate; OR cell; delay variation; digital subthreshold circuit; energy-delay product; high performance subthreshold standard cell design; inverter; subthreshold standard cell library; Circuit simulation; Circuit testing; Delay; Design methodology; Flip-flops; Inverters; Libraries; Ring oscillators; Robustness; Voltage; minimum energy point; standard cell library; subthreshold; transistor utility factor;
Conference_Titel :
Circuits and Systems, 2009. MWSCAS '09. 52nd IEEE International Midwest Symposium on
Conference_Location :
Cancun
Print_ISBN :
978-1-4244-4479-3
Electronic_ISBN :
1548-3746
DOI :
10.1109/MWSCAS.2009.5235946