DocumentCode
3330325
Title
Robust and high performance subthreshold standard cell design
Author
Amarchinta, S. ; Kanitkar, H. ; Kudithipudi, D.
Author_Institution
Dept. of Comput. Eng., Rochester Inst. of Technol., Rochester, NY, USA
fYear
2009
fDate
2-5 Aug. 2009
Firstpage
1183
Lastpage
1186
Abstract
Digital subthreshold circuits are gaining importance because of their ability to serve as an ideal low power solution. In this paper, a methodology to design a performance enhanced subthreshold standard cell library robust to process variations is discussed. Several approaches to design a performance enhanced cell library are discussed and an optimal design choice is made with energy-delay product as a metric. Significant performance improvements of 2X, 8X and 1.5X are achieved for inverter, AND, and OR cells respectively over regular cell library. The variation in delay for the proposed standard cell library with respect to four process corners is studied. A significant reduction of about 75.6% in delay variation across worst case process corners was observed when a normal inverter and inverter from the high performance cell library were simulated.
Keywords
CMOS digital integrated circuits; integrated circuit design; invertors; logic gates; low-power electronics; AND gate; OR cell; delay variation; digital subthreshold circuit; energy-delay product; high performance subthreshold standard cell design; inverter; subthreshold standard cell library; Circuit simulation; Circuit testing; Delay; Design methodology; Flip-flops; Inverters; Libraries; Ring oscillators; Robustness; Voltage; minimum energy point; standard cell library; subthreshold; transistor utility factor;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2009. MWSCAS '09. 52nd IEEE International Midwest Symposium on
Conference_Location
Cancun
ISSN
1548-3746
Print_ISBN
978-1-4244-4479-3
Electronic_ISBN
1548-3746
Type
conf
DOI
10.1109/MWSCAS.2009.5235946
Filename
5235946
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