Digital Implementation of a BIST Method based on Binary Observations

Author

Blanc, C. Le ; Colinet, E. ; Juillard, J. ; Anghel, L.

Author_Institution

CEA LETI Minatech, Grenoble

fYear

2008

fDate

3-5 Sept. 2008

Firstpage

709

Lastpage

713

Abstract

This article deals with a built-in self-test method using only a one-bit ADC and a one-bit DAC. It is theoretically possible to use a binary white noise and binary observations to estimate the impulse response and the output of a linear system, provided this system has good mixing properties. We show how this can be easily implemented on digital programmable targets. The FPGA-based identification of the impulse response of a bandpass filter is performed and the experimental results are presented.

Keywords

analogue-digital conversion; band-pass filters; built-in self test; digital-analogue conversion; field programmable gate arrays; impulse noise; white noise; BIST method; FPGA-based identification; bandpass filter; binary observations; binary white noise; built-in self-test method; impulse response; linear system; Application specific integrated circuits; Band pass filters; Built-in self-test; Design methodology; Digital systems; Impulse testing; Iterative algorithms; Linear systems; Micromechanical devices; White noise; BIST; FPGA; binary observations; impulse response; one bit ADC;

fLanguage

English

Publisher

ieee

Conference_Titel

Digital System Design Architectures, Methods and Tools, 2008. DSD '08. 11th EUROMICRO Conference on

Conference_Location

Parma

Print_ISBN

978-0-7695-3277-6

Type

conf

DOI

10.1109/DSD.2008.50

Filename

4669306