DocumentCode :
3330501
Title :
Analog Fault Simulation: Need it? No. It is already done
Author :
Atwood, Eugene R.
Author_Institution :
IBM Microelectronics Division
fYear :
1999
fDate :
1999
Firstpage :
649
Lastpage :
649
Keywords :
Analog circuits; Circuit faults; Circuit simulation; Circuit testing; Environmental economics; Logic devices; Microelectronics; Semiconductor process modeling; Switches; Switching circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1999. Proceedings. International
ISSN :
1089-3539
Print_ISBN :
0-7803-5753-1
Type :
conf
DOI :
10.1109/TEST.1999.805790
Filename :
805790
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3330501
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