Title :
Finite state machine synthesis with concurrent error detection
Author :
Zeng, Chaohuang ; Saxena, Nirmal ; McCluskey, Edward J.
Author_Institution :
Dept. of Electr. Eng., Stanford Univ., CA, USA
Abstract :
A new synthesis technique for designing finite state machines with on-line parity checking is presented. The output logic and the next-state logic of the finite state machines are checked independently. By checking parity on the present state instead of the next state, this technique allows detection of errors in bistable elements (that were hitherto not detected by many previous techniques) while requiring no changes in the original machine specifications. This paper also examines design choices with respect to parity prediction circuits. Two such examined choices are the multi-parity-group and the single-parity-group techniques. A new state encoding technique based on the JEDI program is developed for the synthesis of the next-state logic with an additional parity output. Synthesis results produced by our proposed procedure for the MCNC´89 FSM benchmark circuits show on average a 25% reduction in literal counts compared to previous techniques
Keywords :
built-in self test; combinational circuits; error detection codes; finite state machines; logic CAD; sequential circuits; state assignment; JEDI program; MCNC´89 FSM benchmark circuits; bistable elements; combinational circuit; concurrent error detection; design choices; finite state machine synthesis; multi-parity-group technique; next-state logic; on-line parity checking; output logic; parity prediction circuits; reduction in literal counts; self-checking FSM; sequential circuit synthesis; single-parity-group technique; state assignment; state diagram; state encoding technique; Automata; Circuit faults; Circuit synthesis; Computer errors; Condition monitoring; Constraint optimization; Encoding; Fault detection; Logic circuits; Sequential circuits;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805795