DocumentCode :
3330648
Title :
PC manufacturing test in a high volume environment
Author :
Williams, David
Author_Institution :
Dell Comput. Corp., Austin, TX, USA
fYear :
1999
fDate :
1999
Firstpage :
698
Lastpage :
704
Abstract :
This paper will introduce the reader to a wide range of issues related to choosing and implementing the proper manufacturing test philosophy for a given situation. The issues which need to be understood when formulating a manufacturing test philosophy are the manufacturing environment, the customer´s requirements, the fault spectrum of interest, and the relative strengths and weaknesses of different system testing schemes. This paper will then look at Dell specifically and toward future issues affecting manufacturing of PCs
Keywords :
computer testing; failure analysis; fault diagnosis; microcomputers; production testing; Dell; PC manufacturing test; customer requirements; data collection process; fault spectrum; high volume environment; manufacturing environment; manufacturing process failures; manufacturing test philosophy; system integration failures; system testing schemes; test cost models; vendor related failures; Assembly systems; Computer aided manufacturing; Costs; Manufacturing processes; Marine vehicles; Pipelines; Production facilities; Pulp manufacturing; Runtime; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1999. Proceedings. International
Conference_Location :
Atlantic City, NJ
ISSN :
1089-3539
Print_ISBN :
0-7803-5753-1
Type :
conf
DOI :
10.1109/TEST.1999.805798
Filename :
805798
Link To Document :
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