DocumentCode
3330648
Title
PC manufacturing test in a high volume environment
Author
Williams, David
Author_Institution
Dell Comput. Corp., Austin, TX, USA
fYear
1999
fDate
1999
Firstpage
698
Lastpage
704
Abstract
This paper will introduce the reader to a wide range of issues related to choosing and implementing the proper manufacturing test philosophy for a given situation. The issues which need to be understood when formulating a manufacturing test philosophy are the manufacturing environment, the customer´s requirements, the fault spectrum of interest, and the relative strengths and weaknesses of different system testing schemes. This paper will then look at Dell specifically and toward future issues affecting manufacturing of PCs
Keywords
computer testing; failure analysis; fault diagnosis; microcomputers; production testing; Dell; PC manufacturing test; customer requirements; data collection process; fault spectrum; high volume environment; manufacturing environment; manufacturing process failures; manufacturing test philosophy; system integration failures; system testing schemes; test cost models; vendor related failures; Assembly systems; Computer aided manufacturing; Costs; Manufacturing processes; Marine vehicles; Pipelines; Production facilities; Pulp manufacturing; Runtime; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1999. Proceedings. International
Conference_Location
Atlantic City, NJ
ISSN
1089-3539
Print_ISBN
0-7803-5753-1
Type
conf
DOI
10.1109/TEST.1999.805798
Filename
805798
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