Title :
DFT, test lifecycles and the product lifecycle
Author :
Robinson, Gordon D.
Author_Institution :
Credence Syst. Corp., Fremont, CA, USA
Abstract :
There´s more to DFT than scan, BIST and ATPG. These have automated the easy tasks, yet many activities in the lifecycles of tests and products use less formalized DFT methods and tools. Three independent but interacting lifecycles are used to identify activities that DFT should help. These lifecycles illustrate the technical and managerial constraints on making full use of DFT structures, particularly for the critical project-threatening tasks where not everything goes smoothly
Keywords :
automatic test equipment; automatic test software; built-in self test; computer testing; design for testability; integrated circuit testing; life testing; printed circuit testing; production testing; ASIC production test; BIST; DFT; Oracle; board production test; critical project-threatening tasks; integration lifecycle; managerial constraints; product lifecycle; system diagnostics; technical constraints; test equipment; test lifecycles; test software; Automatic test pattern generation; Automatic testing; Automation; Built-in self-test; Design for testability; Discrete Fourier transforms; Fault diagnosis; Life testing; Production; Project management;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805799
