Embedded Diagnostic Logic Test Exploiting Regularity

Fault diagnosis has recently become an important issue in IC production test because of the need to enforce high manufacturing yield. Furthermore, fault diagnosis is a pre-condition for any technology of built-in self repair that may be used in the field of application where long-time dependable systems are necessary. An "embedded" diagnostic self test has to get along with a minimum of memory space and computing power, since it may have to make a system working during a system start-up phase. Using inherent regularity on logic de-signs can simplify diagnostic tests considerably by reducing the amount of reference data significantly.