• DocumentCode
    3330835
  • Title

    Testing high speed high accuracy analog to digital converters embedded in systems on a chip

  • Author

    Max, Solomon

  • Author_Institution
    LTX Corp., Westwood, MA, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    763
  • Lastpage
    771
  • Abstract
    High speed high accuracy ADC´s built on SOC IC´s tested on digital testers with round-trip-delays, must measure INL, DNL, Gain and Offset. Algorithm efficiencies and round-trip-delay sensitivity are analyzed. Efficient test methods are described
  • Keywords
    analogue-digital conversion; delay estimation; embedded systems; gain measurement; high-speed integrated circuits; integrated circuit testing; timing; AC histogram test method; DNL; INL; SOC IC; algorithm efficiencies; differential nonlinearity; digital testers; gain; high speed high accuracy A/D converters; integral nonlinearity; offset; ramp histogram test method; round-trip-delay sensitivity; round-trip-delays; test methods; timing constraints; Analog-digital conversion; Circuit testing; Clocks; Feedback loop; Histograms; Logic testing; System testing; System-on-a-chip; Test pattern generators; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1999. Proceedings. International
  • Conference_Location
    Atlantic City, NJ
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-5753-1
  • Type

    conf

  • DOI
    10.1109/TEST.1999.805806
  • Filename
    805806
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3330835