Accuracy requirements in at-speed functional test

Author

West, Burnell G.

Author_Institution

Schlumberger ATE, San Jose, CA, USA

fYear

1999

fDate

1999

Firstpage

780

Lastpage

787

Abstract

This paper analyzes the requirements of at-speed functional testing of high-speed devices. We conclude that, although the requirement forecast by the International Technology Roadmap for Semiconductors is excessive, higher accuracy at-speed functional test systems are needed to qualify the high-performance devices anticipated in the next decade. We also conclude that, while challenging, the necessary higher speeds and accuracies can be realized

Keywords

automatic testing; design for testability; digital integrated circuits; high-speed integrated circuits; integrated circuit testing; accuracy requirements; at-speed functional test; digital IC test; high-performance devices; high-speed devices; input timing accuracy; metastability; yield model; Accuracy; Circuit noise; Circuit testing; Design for testability; Electronic equipment testing; Metastasis; Physics; Semiconductor device testing; Test equipment; Timing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1999. Proceedings. International

Conference_Location

Atlantic City, NJ

ISSN

1089-3539

Print_ISBN

0-7803-5753-1

Type

conf

DOI

10.1109/TEST.1999.805808

Filename

805808

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3330853