DocumentCode
3331011
Title
The test requirements model (TeRM) communicating test information throughout the product life cycle
Author
Shombert, Lee A. ; Davis, Danny C. ; Bukata, Eric M.
Author_Institution
AverStar Inc., Vienna, VA, USA
fYear
1999
fDate
1999
Firstpage
868
Lastpage
876
Abstract
Test information that is necessary to properly verify product functionality and performance and isolate faults is collected throughout the product life cycle. Unfortunately, this information is seldom captured in a format that can be reused at subsequent life-cycle stages. This paper describes a formal information-based methodology, called the Test Requirements Model (TeRM) that can be shown to facilitate the transfer of test-related product information between various stages of the life cycle and to higher-level assemblies in a system (including embedded cores in integrated circuits.)
Keywords
design for testability; electronic equipment testing; product development; production testing; systems engineering; TeRM; embedded cores; formal information-based methodology; higher-level assemblies; integrated circuits; performance; product functionality; product life cycle; test requirements model; Assembly systems; Automatic testing; Circuit faults; Circuit testing; Integrated circuit modeling; Integrated circuit testing; Life testing; Power supplies; Springs; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1999. Proceedings. International
Conference_Location
Atlantic City, NJ
ISSN
1089-3539
Print_ISBN
0-7803-5753-1
Type
conf
DOI
10.1109/TEST.1999.805818
Filename
805818
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