• DocumentCode
    3331011
  • Title

    The test requirements model (TeRM) communicating test information throughout the product life cycle

  • Author

    Shombert, Lee A. ; Davis, Danny C. ; Bukata, Eric M.

  • Author_Institution
    AverStar Inc., Vienna, VA, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    868
  • Lastpage
    876
  • Abstract
    Test information that is necessary to properly verify product functionality and performance and isolate faults is collected throughout the product life cycle. Unfortunately, this information is seldom captured in a format that can be reused at subsequent life-cycle stages. This paper describes a formal information-based methodology, called the Test Requirements Model (TeRM) that can be shown to facilitate the transfer of test-related product information between various stages of the life cycle and to higher-level assemblies in a system (including embedded cores in integrated circuits.)
  • Keywords
    design for testability; electronic equipment testing; product development; production testing; systems engineering; TeRM; embedded cores; formal information-based methodology; higher-level assemblies; integrated circuits; performance; product functionality; product life cycle; test requirements model; Assembly systems; Automatic testing; Circuit faults; Circuit testing; Integrated circuit modeling; Integrated circuit testing; Life testing; Power supplies; Springs; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1999. Proceedings. International
  • Conference_Location
    Atlantic City, NJ
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-5753-1
  • Type

    conf

  • DOI
    10.1109/TEST.1999.805818
  • Filename
    805818