Title :
Flexible ATE module with reconfigurable circuit and its application [to CMOS imager test]
Author :
Kitagaki, Takashi
Author_Institution :
Silicon-Syst. Test Div., Hewlett-Packard Japan Ltd., Tokyo, Japan
Abstract :
Digital output signal of a mixed signal device contains analog information which requires post data processing to evaluate a device after acquiring data from it. This data processing typically has been done in a tester controller which is a workstation or PC, but slower bandwidth between data capture module and tester controller degrades test throughput. This data transfer time can be reduced only by custom test module that has capability of localized post data processing. In this paper, reconfigurable test module is presented. It can be configured as a dedicated test apparatus for various DUTs in a short design period. We have configured this module for CMOS imager test and it results in a reduction of four in test time
Keywords :
CMOS image sensors; automatic test equipment; integrated circuit testing; mixed analogue-digital integrated circuits; programmable logic devices; CMOS imager test; SRAM type PLD; analog information; data transfer time; dedicated test apparatus; digital data processor; digital output signal; flexible ATE module; localized DSP system; mixed signal IC; mixed signal device; module implementation; post data processing; reconfigurable circuit; reconfigurable test module; short design period; test throughput; tester controller; user function design flow; Bandwidth; Circuit testing; Data processing; Degradation; Digital signal processing; Flexible printed circuits; Reconfigurable logic; Signal processing; System testing; Throughput;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805826
