• DocumentCode
    3331192
  • Title

    On the charge density measured by the capacitive probe

  • Author

    Fang, Zhu

  • Author_Institution
    Centre for Electr. Power Eng., Strathclyde Univ., Glasgow, UK
  • fYear
    1996
  • fDate
    25-30 Sep 1996
  • Firstpage
    229
  • Lastpage
    234
  • Abstract
    In investigation on behaviour of excess charge on an electric insulator, a capacitive probe is usually used to detect this charge. The relation between response of the probe and the excess charge density varies with the shape of the insulator. For very thin film, the record of the probe is 1/εr times of the excess charge density; and 2ε0/(ε01 ) times of the excess charge density for thick slab. In the case of right cylindrical spacer, the response of the probe is equal to the excess charge density when its distribution on the circumference is uniform
  • Keywords
    charge measurement; insulating thin films; insulator testing; probes; capacitive probe; charge density measurement; charge distribution; electric insulator; excess charge; right cylindrical spacer; Capacitive sensors; Charge measurement; Conductive films; Current measurement; Density measurement; Dielectric measurements; Gas insulation; Polarization; Probes; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrets, 1996. (ISE 9), 9th International Symposium on
  • Conference_Location
    Shanghai
  • Print_ISBN
    0-7803-2695-4
  • Type

    conf

  • DOI
    10.1109/ISE.1996.578074
  • Filename
    578074