DocumentCode
3331192
Title
On the charge density measured by the capacitive probe
Author
Fang, Zhu
Author_Institution
Centre for Electr. Power Eng., Strathclyde Univ., Glasgow, UK
fYear
1996
fDate
25-30 Sep 1996
Firstpage
229
Lastpage
234
Abstract
In investigation on behaviour of excess charge on an electric insulator, a capacitive probe is usually used to detect this charge. The relation between response of the probe and the excess charge density varies with the shape of the insulator. For very thin film, the record of the probe is 1/εr times of the excess charge density; and 2ε0/(ε0+ε1 ) times of the excess charge density for thick slab. In the case of right cylindrical spacer, the response of the probe is equal to the excess charge density when its distribution on the circumference is uniform
Keywords
charge measurement; insulating thin films; insulator testing; probes; capacitive probe; charge density measurement; charge distribution; electric insulator; excess charge; right cylindrical spacer; Capacitive sensors; Charge measurement; Conductive films; Current measurement; Density measurement; Dielectric measurements; Gas insulation; Polarization; Probes; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrets, 1996. (ISE 9), 9th International Symposium on
Conference_Location
Shanghai
Print_ISBN
0-7803-2695-4
Type
conf
DOI
10.1109/ISE.1996.578074
Filename
578074
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