• DocumentCode
    3331389
  • Title

    Monitoring of metalized film capacitors degradation with impedance nonlinearity measurement

  • Author

    Placek, Martin ; Mach, P.

  • Author_Institution
    Dept. of Electrotechnol., Czech Tech. Univ. in Prague, Prague, Czech Republic
  • fYear
    2013
  • fDate
    24-27 Oct. 2013
  • Firstpage
    263
  • Lastpage
    266
  • Abstract
    Self-healing capacitors fabricated of metalized polypropylene film as the dielectric material are widely used in power electronics. Self-healing process makes elimination of local defects in these capacitors possible and extends the life-time of them. It was shown that the measuring of capacitor V/A characteristic nonlinearity is usable and effective tool for monitoring of capacitor quality. Six capacitors of this type were aged in an oven at the temperature of 90 °C for 1000 hours under normal ambient conditions and changes caused by ageing were monitored with the nonlinearity measurement. It was found that nonlinearity of capacitor grows with the time of ageing.
  • Keywords
    ageing; dielectric thin films; electric impedance measurement; thin film capacitors; ageing; capacitor V-A characteristic nonlinearity; capacitor degradation; capacitor quality; dielectric material; impedance nonlinearity measurement; local defects; metalized polypropylene film; power electronics; self-healing capacitors; self-healing process; Aging; Capacitors; Current measurement; Electrodes; Polymer films; Temperature measurement; Capacitor of metallized film; nonlinearity measurement; nonlinearity of I/V characteristic; self-healing capacitor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Technology in Electronic Packaging (SIITME), 2013 IEEE 19th International Symposium for
  • Conference_Location
    Galati
  • Type

    conf

  • DOI
    10.1109/SIITME.2013.6743687
  • Filename
    6743687