• DocumentCode
    3331407
  • Title

    LabPET inter-crystal scatter study using GATE

  • Author

    Rechka, Sanae ; Fontaine, Réjean ; Lecomte, Roger ; Rafecas, Magdalena

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Eng., Univ. de Sherbrooke, Sherbrooke, QC, Canada
  • fYear
    2009
  • fDate
    Oct. 24 2009-Nov. 1 2009
  • Firstpage
    3988
  • Lastpage
    3994
  • Abstract
    Using GATE, the Geant4 application for tomographic emission, the inter-crystal scatter (ICS) in the LabPET scanner has been characterized with respect to detection efficiency and quantification, for different energy thresholds and gamma ray incidence angles. Simulations have shown that for a direct angle of incidence and an energy threshold of 350 keV, the number of the ICS events is estimated to be 8% of the total recorded events. By lowering the energy threshold from 350 keV to 0 keV, the detection efficiency of the primary events increases by nearly a factor of 3; however at 0 keV the number of the ICS events is estimated to be 26% of the total recorded events and their distribution is expanded over the whole scanner. Finally, it has been shown that for all thresholds oblique angles of incidence have a negligible effect on the fraction of the ICS events but may change their spatial distribution.
  • Keywords
    Compton effect; Monte Carlo methods; biomedical equipment; gamma-ray detection; positron emission tomography; solid scintillation detectors; GATE; Geant4 Application for Tomographic Emission; LabPET scanner; detection efficiency; energy threshold; gamma-ray incidence angle; intercrystal scatter events; Atomic measurements; Detectors; Electromagnetic scattering; Energy resolution; Event detection; Packaging; Particle scattering; Photonic crystals; Positron emission tomography; Rayleigh scattering; GATE; Geant4; LabPET; PET; detection efficiency; energy threshold; inter-crystal scatter (ICS); simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-3961-4
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2009.5401936
  • Filename
    5401936