DocumentCode
3331466
Title
The effects of test compaction on fault diagnosis
Author
Shao, Yun ; Guo, Ruifeng ; Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution
Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
fYear
1999
fDate
1999
Firstpage
1083
Lastpage
1089
Abstract
The effect of test compaction on fault diagnosis is experimentally investigated. Results for combinational and sequential circuits indicate that the diagnostic resolution achieved by compacted tests is only minimally lower than that for uncompacted tests. Furthermore, the diagnostic resolution of the compacted tests can be enhanced to be the same or better than that for the uncompacted rests while still retaining compactness
Keywords
combinational circuits; fault diagnosis; logic testing; sequential circuits; combinational circuits; compacted tests; diagnostic resolution; fault diagnosis; logic testing; sequential circuits; test compaction; uncompacted tests; Circuit faults; Circuit testing; Cities and towns; Combinational circuits; Compaction; Electrical fault detection; Fault detection; Fault diagnosis; Sequential analysis; Sequential circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1999. Proceedings. International
Conference_Location
Atlantic City, NJ
ISSN
1089-3539
Print_ISBN
0-7803-5753-1
Type
conf
DOI
10.1109/TEST.1999.805842
Filename
805842
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