• DocumentCode
    3331545
  • Title

    Influence of O2 plasma treatment on H2 post-treated BZO thin films for TCO of a-Si solar cell

  • Author

    Yoo, Ha Jin ; Son, Chang Gil ; Choi, Eun Ha ; Cho, Guangsup ; Kwon, Gi Chung ; Cho, Won Tea ; Park, Sang Gi

  • Author_Institution
    Dept. of Electrophys., Kwangwoon Univ., Seoul, South Korea
  • fYear
    2010
  • fDate
    20-24 June 2010
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    In order to achieve a high efficient a-Si solar cell, the TCO (transparent conductive oxide) substrates are required to be a low sheet resistivity, a high transparency, and a textured surface with light trapping effect. Recently, a zinc oxide (ZnO) thin film attracts our attention as new coating material having a good transparent and conductive for TCO of solar cells1-2.
  • Keywords
    II-VI semiconductors; boron; hydrogen; oxygen; plasma CVD coatings; semiconductor growth; semiconductor thin films; silicon; solar cells; wide band gap semiconductors; zinc compounds; H2; O2; Si; Si thin film solar cell; ZnO:B; coating material; light trapping effect; low sheet resistivity; metal organic chemical vapor deposition; plasma treatment; post-treated thin films; transparent conductive oxide; Hydrogen; Optical films; Photovoltaic cells; Plasma applications; Plasma measurements; Plasma properties; Surface morphology; Surface treatment; Transistors; Zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2010 Abstracts IEEE International Conference on
  • Conference_Location
    Norfolk, VA
  • ISSN
    0730-9244
  • Print_ISBN
    978-1-4244-5474-7
  • Electronic_ISBN
    0730-9244
  • Type

    conf

  • DOI
    10.1109/PLASMA.2010.5534131
  • Filename
    5534131