• DocumentCode
    3331561
  • Title

    High time for high level ATPG

  • Author

    Cheng, Wu-Tung

  • Author_Institution
    Mentor Graphics Corporation
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    1113
  • Lastpage
    1113
  • Keywords
    Abstracts; Automatic test pattern generation; Circuit faults; Circuit testing; Computational complexity; Foundries; Graphics; Integrated circuit testing; Manufacturing; Semiconductor device testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1999. Proceedings. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-5753-1
  • Type

    conf

  • DOI
    10.1109/TEST.1999.805848
  • Filename
    805848
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3331561