Title :
High Time for Higher Level BIST
Author :
Papachristou, Chris
Author_Institution :
Case Western Reserve University
Keywords :
Automatic test pattern generation; Built-in self-test; Circuit faults; Circuit synthesis; Circuit testing; Design methodology; Logic design; Logic testing; Manufacturing; Very large scale integration;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805851
