DocumentCode
3331669
Title
High-level ATPG for Early Power Analysis
Author
Roethig, Wolfgang
Author_Institution
NEC Electronics
fYear
1999
fDate
1999
Firstpage
1119
Lastpage
1119
Keywords
Analytical models; Automatic test pattern generation; Circuit simulation; Circuit testing; Energy consumption; National electric code; Power generation; Power measurement; Silicon; Statistics;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1999. Proceedings. International
ISSN
1089-3539
Print_ISBN
0-7803-5753-1
Type
conf
DOI
10.1109/TEST.1999.805853
Filename
805853
Link To Document