DocumentCode
3331710
Title
Applying lessons learned from TDDB testing
Author
Prendergast, James
Author_Institution
Institute Of Technology Tralee
fYear
1999
fDate
1999
Firstpage
1123
Lastpage
1123
Keywords
Data analysis; Dielectric breakdown; Dielectric materials; Electric breakdown; Failure analysis; Kinetic theory; Lead compounds; Predictive models; Testing; Virtual manufacturing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1999. Proceedings. International
ISSN
1089-3539
Print_ISBN
0-7803-5753-1
Type
conf
DOI
10.1109/TEST.1999.805856
Filename
805856
Link To Document