Title :
Applying lessons learned from TDDB testing
Author :
Prendergast, James
Author_Institution :
Institute Of Technology Tralee
Keywords :
Data analysis; Dielectric breakdown; Dielectric materials; Electric breakdown; Failure analysis; Kinetic theory; Lead compounds; Predictive models; Testing; Virtual manufacturing;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805856
