DocumentCode
3331729
Title
ITC´99 Benchmark Circuits - Preliminary Results
Author
Davidson, Scott
Author_Institution
Sun Microsystems Inc.
fYear
1999
fDate
1999
Firstpage
1125
Lastpage
1125
Keywords
Application specific integrated circuits; Automatic test pattern generation; Benchmark testing; Clocks; Explosions; Microprocessors; Modems; Software testing; Sun; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1999. Proceedings. International
ISSN
1089-3539
Print_ISBN
0-7803-5753-1
Type
conf
DOI
10.1109/TEST.1999.805857
Filename
805857
Link To Document