DocumentCode :
3331810
Title :
Panel: Increasing test coverage in a VLSI desgin course
Author :
Agrawal, Vishwani D.
Author_Institution :
Bell Labs, Lucent Technologies
fYear :
1999
fDate :
30-30 Sept. 1999
Firstpage :
1131
Lastpage :
1131
Keywords :
Design engineering; Educational institutions; Jacobian matrices; Materials testing; Paper technology; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1999. Proceedings. International
Conference_Location :
Atlantic City, NJ, USA
ISSN :
1089-3539
Print_ISBN :
0-7803-5753-1
Type :
conf
DOI :
10.1109/TEST.1999.805863
Filename :
805863
Link To Document :
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