مرکز منطقه ای اطلاع رساني علوم و فناوري - Panel: Increasing test coverage in a VLSI desgin course

DocumentCode :

3331810

Title :

Panel: Increasing test coverage in a VLSI desgin course

Author :

Agrawal, Vishwani D.

Author_Institution :

Bell Labs, Lucent Technologies

fYear :

1999

fDate :

30-30 Sept. 1999

Firstpage :

1131

Lastpage :

1131

Keywords :

Design engineering; Educational institutions; Jacobian matrices; Materials testing; Paper technology; Very large scale integration;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Test Conference, 1999. Proceedings. International

Conference_Location :

Atlantic City, NJ, USA

ISSN :

1089-3539

Print_ISBN :

0-7803-5753-1

Type :

conf

DOI :

10.1109/TEST.1999.805863

Filename :

805863

Link To Document :