Title :
Panel: Increasing test coverage in a VLSI desgin course
Author :
Agrawal, Vishwani D.
Author_Institution :
Bell Labs, Lucent Technologies
Keywords :
Design engineering; Educational institutions; Jacobian matrices; Materials testing; Paper technology; Very large scale integration;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Conference_Location :
Atlantic City, NJ, USA
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805863