DocumentCode :
3331858
Title :
VLSI design 101 - The test module
Author :
Harrington, J.
Author_Institution :
Lucent Technologies
fYear :
1999
fDate :
30-30 Sept. 1999
Firstpage :
1134
Lastpage :
1134
Keywords :
Controllability; Design for testability; Flip-flops; Isolation technology; Microelectronics; Observability; Stress; Testing; Timing; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1999. Proceedings. International
Conference_Location :
Atlantic City, NJ, USA
ISSN :
1089-3539
Print_ISBN :
0-7803-5753-1
Type :
conf
DOI :
10.1109/TEST.1999.805866
Filename :
805866
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3331858
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