Title :
DFT is all I can afford, who cares about Design for Yield or Design for Reliability!
Author_Institution :
Intel Corporation
Keywords :
Contacts; Design engineering; Design for testability; Integrated circuit interconnections; Integrated circuit testing; LAN interconnection; Physics computing; Process design; Reliability engineering; Very large scale integration;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805873
