DocumentCode

3332034

Title

DFT, DFY, and DFR; Which One(s) Do You Worry About?

Author

Monzel, James A.

Author_Institution

IBM Microelectronics

fYear

1999

fDate

1999

Firstpage

1145

Lastpage

1145

Keywords

Circuit faults; Circuit simulation; Circuit testing; Design for manufacture; Design for testability; Fault detection; Microelectronics; Rivers; Voltage; Wires;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1999. Proceedings. International

ISSN

1089-3539

Print_ISBN

0-7803-5753-1

Type

conf

DOI

10.1109/TEST.1999.805876

Filename

805876