Title :
DFT, DFY, and DFR; Which One(s) Do You Worry About?
Author :
Monzel, James A.
Author_Institution :
IBM Microelectronics
Keywords :
Circuit faults; Circuit simulation; Circuit testing; Design for manufacture; Design for testability; Fault detection; Microelectronics; Rivers; Voltage; Wires;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805876
