Title :
Design for Yield and Reliability is MORE Important Than DFT
Author_Institution :
Texas A&M University
Keywords :
Automatic test pattern generation; Computer science; Costs; Design engineering; Design for testability; Disaster management; Life estimation; Microprocessors; Stress; Testing;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805877
