Title :
"DFY and DFR are more important than DFT"
Author_Institution :
Intel Corporation
Keywords :
Circuit faults; Circuit testing; Design for testability; Design optimization; Gate leakage; Leak detection; Leakage current; Manufacturing; Process design; Silicon;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805878
