DocumentCode
3332070
Title
"DFY and DFR are more important than DFT"
Author
Wu, David M.
Author_Institution
Intel Corporation
fYear
1999
fDate
1999
Firstpage
1147
Lastpage
1147
Keywords
Circuit faults; Circuit testing; Design for testability; Design optimization; Gate leakage; Leak detection; Leakage current; Manufacturing; Process design; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1999. Proceedings. International
ISSN
1089-3539
Print_ISBN
0-7803-5753-1
Type
conf
DOI
10.1109/TEST.1999.805878
Filename
805878
Link To Document