Title :
Using STIL to describe embedded core test requirements
Author_Institution :
IBM Corp., USA
Abstract :
STIL was developed primarily to facilitate the exchange of test patterns from the source of the patterns to automatic test equipment (ATE) that will apply the patterns to the circuit. It seems a natural extension to allow preexisting tests for an embedded core to be provided in STIL format. Additional information is considered essential to allow the re-use of such test patterns. The IEEE P1500 Core Test Language task force has chosen to extend STIL so that a description of an embedded core´s test requirements can be supplied in STIL syntax-possibly along with the actual test patterns for the embedded core
Keywords :
IEEE standards; automatic test pattern generation; boundary scan testing; embedded systems; high level languages; integrated circuit testing; logic testing; microprocessor chips; IEEE P1500 Core Test Language; STIL use; automatic test equipment; embedded core test requirements; exchange of test patterns; semantic constructs; syntactic format; test pattern re-use; Automatic test equipment; Automatic testing; Built-in self-test; Circuit testing; Logic; Pins; Protocols; Standards Working Groups; Test pattern generators;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805881
