• DocumentCode
    3332546
  • Title

    Six challenges in implementation of effective Accelerated Life Tests

  • Author

    Thiraviam, Amar ; Mudge, Will ; Malone, Linda

  • Author_Institution
    Teledyne-ODI, Univ. of Central Florida, Orlando, FL
  • fYear
    2009
  • fDate
    26-29 Jan. 2009
  • Firstpage
    47
  • Lastpage
    52
  • Abstract
    Accelerated life testing (ALT) is an effective method of demonstrating and improving product reliability in applications where the products are expected to perform for a long period of time. Even though reliability professionals recognize the significance of high reliability, there are certain challenges which hinder an effective application of ALT principles in practical applications. This paper presents the six primary challenges that need to be considered during the planning and implementation of ALT and shows through means of a case study, how inadequate planning of ALT can result in expensive field failures. It also discusses the subsequent improvements that focus on the above principles to develop an improved plan. ALT plays a key role in the engineering development of products where high reliabilities are required. The case study discussed demonstrates the six challenges in effective implementation of such tests. The case study also showed the necessity for research in areas such as acceleration models for pressure and further investigation of aging effects of materials used.
  • Keywords
    life testing; reliability; accelerated life tests; aging effects; product reliability; Acceleration; Failure analysis; Input variables; Inverse problems; Life estimation; Life testing; Parameter estimation; Performance evaluation; Physics; Stress; Accelerated Testing; Electrical; Sub-Sea;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 2009. RAMS 2009. Annual
  • Conference_Location
    Fort Worth, TX
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4244-2508-2
  • Electronic_ISBN
    0149-144X
  • Type

    conf

  • DOI
    10.1109/RAMS.2009.4914648
  • Filename
    4914648