Title :
Development and integration of a microcomputer based image analysis system for automatic PCB inspection
Author :
Charette, C. ; Park, S. ; Williams, R. ; Banhabib, B. ; Smith, K.C.
Author_Institution :
Toronto Univ., Ont., Canada
Abstract :
Completely repeatable inspection of printed circuit boards (PCBs) requires that the inspection be automated. The cost of such inspection is beyond most medium to small PCB manufacturers. The authors address this problem with a microcomputer-based image-analysis system. Illumination, filtering, and flaw detection of the IBM-AT-based system are addressed. The authors conclude that when processing costs are reduced, the system will be viable and cost-effective
Keywords :
IBM computers; computer vision; computerised monitoring; inspection; microcomputer applications; printed circuit manufacture; IBM-AT-based system; automatic PCB inspection; filtering; flaw detection; image analysis system; microcomputing; printed circuit boards; repeatable inspection; Conductors; Hardware; Image analysis; Inspection; Laboratories; Manufacturing; Mechanical engineering; Microcomputers; Printed circuits; Robotics and automation;
Conference_Titel :
Computer Integrated Manufacturing, 1988., International Conference on
Conference_Location :
Troy, NY
Print_ISBN :
0-8186-0888-9
DOI :
10.1109/CIM.1988.5402
