• DocumentCode
    3332764
  • Title

    High frequency characteristics of modular metric, high-density connector systems

  • Author

    Wallenhorst, U. ; Brenner, Andreas

  • Author_Institution
    HARTING Elektronik GmbH, Espelkamp
  • fYear
    195
  • fDate
    14-18 Aug 195
  • Firstpage
    483
  • Lastpage
    489
  • Abstract
    A signal integrity analysis of modular metric high-density connector systems for use in telecommunication, computer- and other high-speed applications is presented. Carefully designed appropriate high performance test-setups-with different contact-pitch-consisting of backplane and daughtercard are the basis for all time- and frequency-domain measurements like TDR/TDT, crosstalk, insertion loss, VSWR, propagation delay etc. Based on 2-D FEM-calculations high-accurate simulation-models are produced which include multiline-crosstalk. The calculated curves are in an excellent agreement with the measured data. The behaviour in “bus-like” applications (connectors as a part of a stub) is discussed
  • Keywords
    crosstalk; electric connectors; electromagnetic compatibility; finite element analysis; high-frequency transmission line measurement; modules; transmission line theory; 2D FEM; EMC; TDR/TDT; VSWR; backplane; bus-like applications; computer applications; contact pitch; crosstalk; daughtercard; frequency-domain measurement; high frequency characteristics; high performance test setups; high-density connector systems; high-speed applications; insertion loss; modular metric connector systems; multiline crosstalk; propagation delay; signal integrity analysis; simulation models; telecommunication; time-domain measurement; Application software; Backplanes; Connectors; Contacts; Frequency domain analysis; Frequency measurement; Performance loss; Signal analysis; Telecommunication computing; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1995. Symposium Record., 1995 IEEE International Symposium on
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    0-7803-3608-9
  • Type

    conf

  • DOI
    10.1109/ISEMC.1995.523606
  • Filename
    523606