DocumentCode
3333634
Title
Detection of hot spots in thin metal films using an ultra sensitive dual channel noise measurement system
Author
Massiha, G.H. ; Scott, G.J. ; Chen, T.M.
Author_Institution
Dept. of Electr. Eng., South Florida Univ., Tampa, FL, USA
fYear
1989
fDate
9-12 Apr 1989
Firstpage
1310
Abstract
A dual-channel noise measurement system capable of detecting the thermal noise of a 1-Ω resistor at room temperature was designed and constructed. The system was based on amplifying the noise signal under detection through two separated channels and taking the cospectrum estimate of the output of two channels. The system was used to measure the thermal noise and compare effective noise temperatures in electromigration-damaged and undamaged thin aluminium films
Keywords
aluminium; electric noise measurement; electromigration; metallic thin films; metallisation; thermal noise; Al films; cospectrum estimate; dual channel noise measurement system; effective noise temperatures; electromigration damage; hot spot detection; noise signal amplification; thermal noise; thin metal films; Noise figure; Noise generators; Noise level; Noise measurement; Resistors; Strips; Temperature sensors; Thermal resistance; Transistors; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Southeastcon '89. Proceedings. Energy and Information Technologies in the Southeast., IEEE
Conference_Location
Columbia, SC
Type
conf
DOI
10.1109/SECON.1989.132634
Filename
132634
Link To Document